Paper presented at the Taiwan ESD and Reliability Conference in 2010.
Abstract – Nowadays, mobile consumer electronics devices integrate various wireless interfaces like WIFI, Bluetooth, GPRS and GPS. Various approaches exist to protect the wireless interfaces against ESD stress. In recent years, researchers have focused on so-called ‘co-design’ techniques to solve both functional and protection constraints together which requires both RF and ESD design skills.
However many IC designers still prefer to work with ‘plug-n-play’protection concepts where the ESD clamps exhibit low parasitic capacitance, low series resistance and low leakage. This paper presents measurement results of 3 different SCR based protection approaches that exhibit high Q-factor and low and stable parasitic capacitance over a broad voltage and frequency range. The clamps are used for protection of LNA circuits in 90nm and 40nm Low Power (LP) CMOS technologies.
- Read the full paper online through Slideshare
- View the presentation on Slideshare
- Other papers about ESD protection with low parasitic capacitance
- HDMI 1.3 protection up to 8kV HBM
- Datasheets for the clamps described in this paper
- The clamps for this publication are measured on the following technology nodes
- TSMC 90nm
- TSMC 40nm
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